Download Analog Circuit Design for Process Variation-Resilient by Marvin Onabajo PDF

By Marvin Onabajo

This ebook describes a number of ideas to deal with variation-related layout demanding situations for analog blocks in mixed-signal systems-on-chip. The equipment provided are effects from fresh study works concerning receiver front-end circuits, baseband clear out linearization, and information conversion. those circuit-level strategies are defined, with their relationships to rising system-level calibration ways, to song the performances of analog circuits with electronic tips or regulate. insurance additionally features a technique to make the most of on-chip temperature sensors to degree the sign strength and linearity features of analog/RF circuits, as verified via attempt chip measurements.

  • Describes quite a few variation-tolerant analog circuit layout examples, together with from RF front-ends, high-performance ADCs and baseband filters;
  • Includes integrated checking out options, associated with present commercial trends;
  • Balances digitally-assisted functionality tuning with analog functionality tuning and mismatch relief approaches;
  • Describes theoretical techniques in addition to experimental effects for try chips designed with variation-aware techniques.

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Woo, S. Meninger, T. Xanthopoulos, E. Crain, D. Ha, D. Ham;, Dual-DLL-based CMOS all-digital temperature sensor for microprocessor thermal monitoring, in IEEE International 30 48. 49. 50. 51. 52. 53. 54. 55. 56. 57. 58. 59. 60. 61. 2 Process Variation Challenges and Solutions Approaches Solid-State Circuits Conference (ISSCC) Digest of Technical Papers, Feb 2009, pp. 68–69, 69a P. L. Ayala, M. Lopez-Vallejo, A nanowatt smart temperature sensor for dynamic thermal management. IEEE Sens. J. 8(12), 2036–2043 (2008) S.

538–542 23. P. A. K. Reynolds, On-chip spectrum analyzer for analog built-in self test, in Proceedings of IEEE VLSI Test Symposium, May 2005, pp. 131–136 24. A. -L. Hussien, J. Silva-Martinez, E. Sánchez-Sinencio, An integrated frequency response characterization system with a digital interface for analog testing. IEEE J Solid-State Circuits 41(10), 2301–2313 (2006) 25. J. M. Ramzan, Built-in loopback test for IC RF transceivers. IEEE Trans. Very Large Scale Integr. VLSI Syst. 18(6), 933–946 (2010) 26.

2 was derived with k2GmR = 1, ensuring that the signal swing at the output of the auxiliary OTA is the same as at its input. This choice was made to maintain the same maximum input voltage swing as the initial OTA without saturating the OTA in the linearization path. 5). But, this choice is only permissible if a reduction of the maximum input swing by k2GmR can be tolerated, which would imply a reduction in the dynamic range. Typically, choosing k2GmR = 1 is advantageous to maintain the same maximum input voltage swing as the original OTA after the linearization.

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